L. Poperenko, V. Ukraine, S. Rozouvan, I. Yurgelevych, P. Lishchuk
{"title":"Angular Ellipsometry of Porous Silicon Surface Layers","authors":"L. Poperenko, V. Ukraine, S. Rozouvan, I. Yurgelevych, P. Lishchuk","doi":"10.21272/jnep.12(3).03024","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":16514,"journal":{"name":"Journal of Nano- and Electronic Physics","volume":"5 1","pages":"03024-1-03024-4"},"PeriodicalIF":0.0000,"publicationDate":"2020-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Nano- and Electronic Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21272/jnep.12(3).03024","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}