Guofei Jiang, Haifeng Chen, C. Ungureanu, K. Yoshihira
{"title":"Trace Analysis for Fault Detection in Application Servers","authors":"Guofei Jiang, Haifeng Chen, C. Ungureanu, K. Yoshihira","doi":"10.1201/9781315221564-34","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":6643,"journal":{"name":"2015 IEEE International Conference on Autonomic Computing","volume":"22 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2018-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Conference on Autonomic Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781315221564-34","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}