Application of atomic force microscopy to the study of low-temperature strain of elastomeric materials

Abstract

ABSTRACT The present paper demonstrates the possibility of the use of atomic force microscopy (AFM) to study the morphology of elastomeric materials under stretching. A prototype of a stretching device that could be integrated into AFM for the tensile drawing of polymer at different temperatures including low temperature was constructed. As a trial sample for testing the prototype of low temperature stretching device nitrile butadiene rubber (NBR) was selected. The strain-induced morphological changes of neat NBR and NBR with plasticiser were studied. Poisson's ratio and average surface microroughness at different temperatures and strains are measured.