{"title":"STACKING FAULTS IN THE SINGLE CRYSTALS","authors":"Mihir M. Vora, A. Vora","doi":"10.15407/spqeo12.04.421","DOIUrl":null,"url":null,"abstract":"0 ≤ ≤ x have been grown by a direct vapour transport techn ique (DVT) in the laboratory. The structural characterizations of these crystals are made by XRD method. The particle size for a nu mber of reflections has been calculated using the Scherrer’s formula. A con siderable variation is shown in the deformation ( α ) and growth ( β ) fault probabilities in In xMoSe 2 ( ) 1 0 ≤ ≤ x single crystal due to off-stoichiometry, which pos sesses the stacking fault in the single crystal.","PeriodicalId":7403,"journal":{"name":"African Review of Physics","volume":"12 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2009-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"African Review of Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15407/spqeo12.04.421","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Physics and Astronomy","Score":null,"Total":0}
引用次数: 5
Abstract
0 ≤ ≤ x have been grown by a direct vapour transport techn ique (DVT) in the laboratory. The structural characterizations of these crystals are made by XRD method. The particle size for a nu mber of reflections has been calculated using the Scherrer’s formula. A con siderable variation is shown in the deformation ( α ) and growth ( β ) fault probabilities in In xMoSe 2 ( ) 1 0 ≤ ≤ x single crystal due to off-stoichiometry, which pos sesses the stacking fault in the single crystal.
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