Carlos H. S. Coelho, J. Martino, M. Bellodi, E. Simoen, A. Veloso, P. Agopian
{"title":"Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices","authors":"Carlos H. S. Coelho, J. Martino, M. Bellodi, E. Simoen, A. Veloso, P. Agopian","doi":"10.1016/j.mejo.2021.105277","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18617,"journal":{"name":"Microelectron. J.","volume":"3 1","pages":"105277"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microelectron. J.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/j.mejo.2021.105277","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}