Bandwidth and gain enhanced pnp phototransistors for VIS and NIR light IN 180 nm CMOS

P. Kostov, W. Gaberl, M. Hofbauer, H. Zimmermann
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Abstract

Two phototransistor concepts with a size of 40×40 μm2 are presented. These devices were implemented in a 180 nm standard CMOS process without process modifications. The use of a special starting material with a low doped p- epitaxial layer on top of the high doped p+ substrate opens the possibility for achieving high bandwidths and responsivities even for deep penetrating light. Optical characterization of the devices was done at 410 nm, 675 nm and 850 nm. Bandwidths up to 67 MHz and responsivities up to 12.35 A/W were achieved. These devices are well suited for integrated optoelectronic circuits (OEICs).
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180nm CMOS中用于VIS和NIR光的带宽和增益增强的pnp光电晶体管
提出了两个尺寸为40×40 μm2的光电晶体管概念。这些器件在180nm标准CMOS工艺中实现,无需工艺修改。在高掺杂p+衬底上使用具有低掺杂p-外延层的特殊起始材料,甚至可以实现深穿透光的高带宽和高响应率。分别在410 nm、675 nm和850 nm处对器件进行了光学表征。实现了高达67 MHz的带宽和高达12.35 A/W的响应。这些器件非常适合集成光电电路(OEICs)。
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