{"title":"Emergence of biased errors in imperfect photonic circuits","authors":"Fulvio Flamini","doi":"10.1103/PhysRevApplied.16.064038","DOIUrl":null,"url":null,"abstract":"We numerically investigate the impact of imperfections and biased errors in integrated photonic circuits. Our analysis connects and deepens previous studies along the same direction, revealing potential criticalities for high-precision tests and optical implementations of machine learning.","PeriodicalId":6789,"journal":{"name":"2021 Photonics North (PN)","volume":"29 1","pages":"1-1"},"PeriodicalIF":0.0000,"publicationDate":"2021-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 Photonics North (PN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1103/PhysRevApplied.16.064038","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We numerically investigate the impact of imperfections and biased errors in integrated photonic circuits. Our analysis connects and deepens previous studies along the same direction, revealing potential criticalities for high-precision tests and optical implementations of machine learning.
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
