{"title":"A 280nW leakage-ratio-based CMOS temperature sensor with supply/clock sensitivity suppression","authors":"Hangyi Lu","doi":"10.1587/elex.19.20220223","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13437,"journal":{"name":"IEICE Electron. Express","volume":"11 4 1","pages":"20220223"},"PeriodicalIF":0.0000,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEICE Electron. Express","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1587/elex.19.20220223","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
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