Measurement and Analysis of partial discharges patterns in high voltage resin impregnated capacitors

O. G. Gnonhoue, A. Velazquez-Salazar, I. Preda, É. David
{"title":"Measurement and Analysis of partial discharges patterns in high voltage resin impregnated capacitors","authors":"O. G. Gnonhoue, A. Velazquez-Salazar, I. Preda, É. David","doi":"10.1109/CEIDP50766.2021.9705353","DOIUrl":null,"url":null,"abstract":"The presence of defects in the insulating wall of high voltage capacitors can cause early deterioration of the insulating system and can lead to the degradation of electrical properties. The presence of partial discharges (PD) is considered to be one of the main causes of initiation of the degradation of the insulating wall. Accordingly, PD measurement is used as a non-destructive control test in order to assess the quality of a high voltage capacitor. It permits to ensure that the capacitors are free from defects and, in case PD are measured, it can help identifying the types of defects. In this context, the main objective of this work is the identification of Phase-Resolved Partial Discharge (PRPD) patterns and their correlation with the type of defect introduced in the dielectric wall of all-film capacitors impregnated with a thermosetting resin.","PeriodicalId":6837,"journal":{"name":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","volume":"9 1","pages":"295-298"},"PeriodicalIF":0.0000,"publicationDate":"2021-12-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP50766.2021.9705353","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The presence of defects in the insulating wall of high voltage capacitors can cause early deterioration of the insulating system and can lead to the degradation of electrical properties. The presence of partial discharges (PD) is considered to be one of the main causes of initiation of the degradation of the insulating wall. Accordingly, PD measurement is used as a non-destructive control test in order to assess the quality of a high voltage capacitor. It permits to ensure that the capacitors are free from defects and, in case PD are measured, it can help identifying the types of defects. In this context, the main objective of this work is the identification of Phase-Resolved Partial Discharge (PRPD) patterns and their correlation with the type of defect introduced in the dielectric wall of all-film capacitors impregnated with a thermosetting resin.
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高压树脂浸渍电容器局部放电模式的测量与分析
高压电容器绝缘壁缺陷的存在会引起绝缘系统的早期劣化,并导致电性能的退化。局部放电(PD)的存在被认为是引起绝缘壁退化的主要原因之一。因此,局部放电测量被用作一种非破坏性控制测试,以评估高压电容器的质量。它可以确保电容器没有缺陷,并且在测量PD的情况下,它可以帮助识别缺陷的类型。在这种情况下,这项工作的主要目的是确定相分辨局部放电(PRPD)模式及其与热固性树脂浸渍的全膜电容器介电壁中引入的缺陷类型的相关性。
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