Non-destructive testing of thin conducting films : Proceedings of the 12th world conference on non-destructive testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1519–1521. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989
{"title":"Non-destructive testing of thin conducting films : Proceedings of the 12th world conference on non-destructive testing, Amsterdam (Netherlands), 23–28 Apr. 1989, Vol. 2, pp. 1519–1521. Edited by J. Boogaard and G.M. van Dijk, Elsevier, 1989","authors":"V. Gavrilin","doi":"10.1016/0308-9126(90)90937-J","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":100946,"journal":{"name":"NDT International","volume":"12 1","pages":"363"},"PeriodicalIF":0.0000,"publicationDate":"1990-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"NDT International","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/0308-9126(90)90937-J","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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