A 40GS/s 6b ADC in 65nm CMOS

Y. Greshishchev, J. Aguirre, M. Besson, R. Gibbins, C. Falt, Philip Flemke, Naim Ben-Hamida, D. Pollex, P. Schvan, Shing-Chi Wang
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引用次数: 111

Abstract

Progress in 40Gb/s optical dual- polarization (DP) QPSK systems inspired an idea of 100G transmission by optical frequency division multiplexing (FDM) of QPSK-modulated channels [1]. A practical solution suggests two 58Gb/s DP QPSK channels, spaced by 50GHz (Fig. 21.7.1). The challenge is in implementing a 6b ADC operating at sampling rate of 29Gs/s, as compared to 24Gs/s reported before [2]. The other challenge is reduction of ADC sampling jitter. In an interleaved architecture, jitter is limited by the timing mismatch between the clocks of T&H circuits. While initial timing error is compensated during ADC calibration, its spread over the input frequency range and drift may still impact jitter performance. This paper presents, to our knowledge for the first time, a 6b ADC operating up to 40Gs/s with power dissipation ≪ 1.5W. The 30% margin for the sampling rate reduces interleaved timing errors and therefore sampling jitter below 0.25ps-rms. The ADC also includes on-chip test signal synthesizer that generates a gigahertz range sinusoidal signal to simplify production testing.
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采用65nm CMOS的40GS/s 6b ADC
40Gb/s光双偏振(DP) QPSK系统的进展激发了通过QPSK调制通道的光频分复用(FDM)传输100G的想法[1]。一个实用的解决方案是两个58Gb/s的DP QPSK通道,间隔50GHz(图21.7.1)。挑战在于实现以29Gs/s采样率工作的6b ADC,而之前报道的采样率为24Gs/s[2]。另一个挑战是减少ADC采样抖动。在交错结构中,抖动受到T&H电路时钟之间时序不匹配的限制。虽然在ADC校准期间补偿了初始定时误差,但其在输入频率范围内的扩散和漂移仍可能影响抖动性能。据我们所知,本文首次介绍了一种工作速度高达40Gs/s、功耗≪1.5W的6b ADC。采样率的30%余量减少了交错时序误差,因此采样抖动低于0.25ps-rms。该ADC还包括片上测试信号合成器,可生成千兆赫范围的正弦信号,以简化生产测试。
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