{"title":"Noise-based logic locking scheme against signal probability skew analysis","authors":"Ahmad Rezaei, Ali Mahani","doi":"10.1049/cdt2.12022","DOIUrl":null,"url":null,"abstract":"<p>Due to integrated circuit (IC) production chain globalisation, several new threats such as hardware trojans, counterfeiting and overproduction are threatening the IC industry. So logic locking is deployed to hinder these security threats. In this technique, an IC is locked, and its functionality is retrieved when the right key is loaded onto it. We propose ‘noise-based’ logic locking, consisting of two separate compliment blocks, which function in three states. By flipping a signal once in the circuit, these modules add corruption to the circuit, whereas either flipping the same signal twice or not flipping leads to the correct functionality. Thus, a low probability skew with a low corruption in the output is obtained by utilisation of these flipping states. We have improved SAT attack resiliency based on time by 17% for a locking block with 14 primary inputs in comparison with the well-known anti-SAT. The area overhead is less in comparison with other schemes, in which extra dummy parts or obfuscation elements are added to their circuit. Also, more crucially, our locking blocks are immune to SPS attack solely. After executing various attacks, retrieved circuits indicate improved overall resiliency against automatic test pattern generation based and approximate guided removal attacks as well.</p>","PeriodicalId":50383,"journal":{"name":"IET Computers and Digital Techniques","volume":"15 4","pages":"279-295"},"PeriodicalIF":1.1000,"publicationDate":"2021-03-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ietresearch.onlinelibrary.wiley.com/doi/epdf/10.1049/cdt2.12022","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IET Computers and Digital Techniques","FirstCategoryId":"94","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1049/cdt2.12022","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 2
Abstract
Due to integrated circuit (IC) production chain globalisation, several new threats such as hardware trojans, counterfeiting and overproduction are threatening the IC industry. So logic locking is deployed to hinder these security threats. In this technique, an IC is locked, and its functionality is retrieved when the right key is loaded onto it. We propose ‘noise-based’ logic locking, consisting of two separate compliment blocks, which function in three states. By flipping a signal once in the circuit, these modules add corruption to the circuit, whereas either flipping the same signal twice or not flipping leads to the correct functionality. Thus, a low probability skew with a low corruption in the output is obtained by utilisation of these flipping states. We have improved SAT attack resiliency based on time by 17% for a locking block with 14 primary inputs in comparison with the well-known anti-SAT. The area overhead is less in comparison with other schemes, in which extra dummy parts or obfuscation elements are added to their circuit. Also, more crucially, our locking blocks are immune to SPS attack solely. After executing various attacks, retrieved circuits indicate improved overall resiliency against automatic test pattern generation based and approximate guided removal attacks as well.
期刊介绍:
IET Computers & Digital Techniques publishes technical papers describing recent research and development work in all aspects of digital system-on-chip design and test of electronic and embedded systems, including the development of design automation tools (methodologies, algorithms and architectures). Papers based on the problems associated with the scaling down of CMOS technology are particularly welcome. It is aimed at researchers, engineers and educators in the fields of computer and digital systems design and test.
The key subject areas of interest are:
Design Methods and Tools: CAD/EDA tools, hardware description languages, high-level and architectural synthesis, hardware/software co-design, platform-based design, 3D stacking and circuit design, system on-chip architectures and IP cores, embedded systems, logic synthesis, low-power design and power optimisation.
Simulation, Test and Validation: electrical and timing simulation, simulation based verification, hardware/software co-simulation and validation, mixed-domain technology modelling and simulation, post-silicon validation, power analysis and estimation, interconnect modelling and signal integrity analysis, hardware trust and security, design-for-testability, embedded core testing, system-on-chip testing, on-line testing, automatic test generation and delay testing, low-power testing, reliability, fault modelling and fault tolerance.
Processor and System Architectures: many-core systems, general-purpose and application specific processors, computational arithmetic for DSP applications, arithmetic and logic units, cache memories, memory management, co-processors and accelerators, systems and networks on chip, embedded cores, platforms, multiprocessors, distributed systems, communication protocols and low-power issues.
Configurable Computing: embedded cores, FPGAs, rapid prototyping, adaptive computing, evolvable and statically and dynamically reconfigurable and reprogrammable systems, reconfigurable hardware.
Design for variability, power and aging: design methods for variability, power and aging aware design, memories, FPGAs, IP components, 3D stacking, energy harvesting.
Case Studies: emerging applications, applications in industrial designs, and design frameworks.