Electret Fabrication Under Various Temperatures and Partial Discharge Mitigation Performance

Abstract

Partial discharge (PD), which causes accelerated dielectric material aging and device failure, has been a chronic dielectric challenge in medium to high voltage applications. Recently, electrets that emit electric fields were reported as a promising solution to the complete mitigation of PD by neutralizing the locally enhanced electric fields. Electrets fabricated at elevated temperature based on the widely used triode corona method allow the charged particles to be trapped in the bulk of the dielectric material, which increases the stability of the electrets. In this study, electrets are fabricated under various temperatures based on the triode-corona charging method with thin polyvinylidene fluoride (PVDF) films, and their PD mitigation performances are experimentally compared by conducting PD measurements. The stable charge density trapped in the bulk of the electrets fabricated at elevated temperature allows the electret-based PD approach to be a promising dielectric solution.