Diffraction-based dual path multispectral imaging

IF 0.8 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Tm-Technisches Messen Pub Date : 2023-05-15 DOI:10.1515/teme-2023-0007
T. Haist, R. Hahn, S. Reichelt
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Abstract

Abstract Diffraction based multispectral imaging is a method for obtaining snapshot multispectral image information by using a structured diffraction grating or computer-generated hologram in an intermediate image plane of an imaging system. Without the need of complicated filter manufacturing it becomes possible to realize application specific spatio-spectral sampling of an image. The spectral resolution is coupled with the spatial resolution because the central stop of the imaging system serves also as the main spectral filtering component. By using two image sensors and the zeroth order of the computer-generated holograms it becomes possible to obtain high resolution spatial information as well as spectral information on a coarser sampling grid.
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基于衍射的双路多光谱成像
基于衍射的多光谱成像是在成像系统的中间像面上利用结构化衍射光栅或计算机生成的全息图获取快照多光谱图像信息的一种方法。无需复杂的滤波器制造,就可以实现特定应用的图像空间光谱采样。由于成像系统的中央光斑也是主要的光谱滤波分量,因此光谱分辨率与空间分辨率是耦合的。通过使用两个图像传感器和计算机生成的零阶全息图,可以在更粗的采样网格上获得高分辨率的空间信息和光谱信息。
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来源期刊
Tm-Technisches Messen
Tm-Technisches Messen 工程技术-仪器仪表
CiteScore
1.70
自引率
20.00%
发文量
105
审稿时长
6-12 weeks
期刊介绍: The journal promotes dialogue between the developers of application-oriented sensors, measurement systems, and measurement methods and the manufacturers and measurement technologists who use them. Topics The manufacture and characteristics of new sensors for measurement technology in the industrial sector New measurement methods Hardware and software based processing and analysis of measurement signals to obtain measurement values The outcomes of employing new measurement systems and methods.
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