R. Grote, K. Padmaraju, J. Driscoll, B. Souhan, K. Bergman, R. Osgood
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引用次数: 1
Abstract
We experimentally demonstrate error-free operation of an all Si ion implanted CMOS compatible PIN photodiode at 1.55 μm with 2.5-Gb/s and 10-Gb/s data rates. Detector sensitivity as a function of bias voltage is measured.
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