Experimental Study on Frequency Stability of Micromechanical Resonators Operating in the Nonlinear Tapping Mode

Chun–Pu Tsai, Jia-Ren Liu, Wei-Chang Li
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引用次数: 3

Abstract

Frequency stability of micromechanical resonators operating in the nonlinear tapping mode was investigated. In particular, a CC-beam oxide-rich resonator based on a CMOS-MEMS process platform exhibits higher frequency stability at the bifurcation points in the nonlinear tapping frequency transmissions, yielding a ∼2× improvement of short-term Allen deviation compared to that at the midpoint of the tapping regime and that operating under the regular nonlinear spring softening (not entering the tapping mode yet). Differing from the previous studies on stability of MEMS resonators in either nonlinear softening or hardening condition [1] [2], this work explores the frequency stability deeper into the tapping mode of MEMS resonators—essentially behaving as resoswitches with no electrical current flowing through the contact—where the devices are subject to highly nonlinear repulsive forces due to impact. The results would help facilitate not only the understanding of the nonlinear dynamics of resoswitches but also the determination of optimum operating points of the devices.
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非线性分接模式下微机械谐振器频率稳定性的实验研究
研究了工作在非线性分接模式下的微机械谐振器的频率稳定性。特别是,基于CMOS-MEMS工艺平台的cc束富氧谐振器在非线性分岔频率传输中表现出更高的频率稳定性,与在分岔状态中点和在常规非线性弹簧软化(尚未进入分岔模式)下工作的分岔点相比,短期艾伦偏差提高了约2倍。与之前关于MEMS谐振器在非线性软化或硬化条件下稳定性的研究不同,这项工作深入探讨了MEMS谐振器的分接模式的频率稳定性-本质上作为无电流流过触点的开关-其中器件受到高度非线性排斥力的影响。研究结果不仅有助于理解开关的非线性动力学,而且有助于确定器件的最佳工作点。
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