{"title":"Nonuniform 2D Mott-Gurney law","authors":"Y. Zhu, L. Ang","doi":"10.1109/PLASMA.2013.6634947","DOIUrl":null,"url":null,"abstract":"For high charge injection into a solid dielectric, the 1D current density is described by the classical Mott-Gurney (MG) law for trap-free solid and Mark-Helfrich (HF) law for trap-filled solid. Recently, due to the development of nanotechnology, the geometry current enhancement is observed in many experiment, such as electron transport in nanowire. In this paper, we develop a numerical method to solved the 2D space charge limited current problem.","PeriodicalId":6313,"journal":{"name":"2013 Abstracts IEEE International Conference on Plasma Science (ICOPS)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2013-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Abstracts IEEE International Conference on Plasma Science (ICOPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PLASMA.2013.6634947","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
For high charge injection into a solid dielectric, the 1D current density is described by the classical Mott-Gurney (MG) law for trap-free solid and Mark-Helfrich (HF) law for trap-filled solid. Recently, due to the development of nanotechnology, the geometry current enhancement is observed in many experiment, such as electron transport in nanowire. In this paper, we develop a numerical method to solved the 2D space charge limited current problem.
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