{"title":"Theory of Frustrated Total Reflection Involving Metallic Surfaces.","authors":"T. R. Young, B. Rothrock","doi":"10.6028/JRES.067A.012","DOIUrl":null,"url":null,"abstract":"The theory for frustrated total reflection has been developed for the case where the third medium is metallic of complex index. Using parallel polarized light a unique minimum in reflectance occurs at a definite film thickness. Experimental verification of the theory is made and indicates the theory applicable to the precise measurement of thin contact films existing between metallic and dielectric surfaces.","PeriodicalId":94340,"journal":{"name":"Journal of research of the National Bureau of Standards. Section A, Physics and chemistry","volume":"582 1","pages":"115-125"},"PeriodicalIF":0.0000,"publicationDate":"1963-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of research of the National Bureau of Standards. Section A, Physics and chemistry","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.6028/JRES.067A.012","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The theory for frustrated total reflection has been developed for the case where the third medium is metallic of complex index. Using parallel polarized light a unique minimum in reflectance occurs at a definite film thickness. Experimental verification of the theory is made and indicates the theory applicable to the precise measurement of thin contact films existing between metallic and dielectric surfaces.
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