Methodology for I/O cell placement and checking in ASIC designs using area-array power grid

P. Buffet, Joseph Natonio, R. Proctor, Yu H. Sun, Gulsun Yasar
{"title":"Methodology for I/O cell placement and checking in ASIC designs using area-array power grid","authors":"P. Buffet, Joseph Natonio, R. Proctor, Yu H. Sun, Gulsun Yasar","doi":"10.1109/CICC.2000.852632","DOIUrl":null,"url":null,"abstract":"Electrical rule checking is fundamental to achieve a good I/O cell placement. This paper presents the analysis techniques used to design a robust power-grid structure, the method used to make I/O cell placement guidelines, details of the I/O cell placement process and electrical checking algorithms.","PeriodicalId":20702,"journal":{"name":"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)","volume":"137 1","pages":"125-128"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2000 Custom Integrated Circuits Conference (Cat. No.00CH37044)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2000.852632","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 22

Abstract

Electrical rule checking is fundamental to achieve a good I/O cell placement. This paper presents the analysis techniques used to design a robust power-grid structure, the method used to make I/O cell placement guidelines, details of the I/O cell placement process and electrical checking algorithms.
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使用区域阵列电网的ASIC设计中的I/O单元放置和检查方法
电气规则检查是实现良好I/O单元放置的基础。本文介绍了鲁棒电网结构设计的分析技术、I/O单元布置指南的制定方法、I/O单元布置过程的细节和电气检查算法。
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