{"title":"Modeling Embedded Software Test Requirement Based on MARTE","authors":"Yichen Wang, Xinsheng Lan, Yikun Wang","doi":"10.1109/SERE-C.2013.43","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":92210,"journal":{"name":"IEEE International Conference on Software Quality, Reliability and Security : proceedings. IEEE International Conference on Software Quality, Reliability and Security","volume":"166 1","pages":"109-115"},"PeriodicalIF":0.0000,"publicationDate":"2013-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Conference on Software Quality, Reliability and Security : proceedings. IEEE International Conference on Software Quality, Reliability and Security","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SERE-C.2013.43","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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