{"title":"Creep behavior inb a fine-grained Al -5356 alloy at low stress and intermediate temperature","authors":"Junjie Shen, K. Ikeda, S. Hata, H. Nakashima","doi":"10.15017/19574","DOIUrl":null,"url":null,"abstract":"m was investigated using the helicoid spring specimen technique. The testing temperatures ranged from 423 K to 523 K (0.47 to 0.58 Tm) and the applied stresses from 0.20 to . It was found that under the above conditions, viscous creep of Bingham type occurs, characterized by a threshold stress which decreases with increasing temperature. The activation energy is Qc = 44 7 kJ/mol. No microstructural changes were observed in recrystallized and the as-crept specimens. The measured creep rates were found to be four orders faster than that predicted by Coble creep model.","PeriodicalId":11722,"journal":{"name":"Engineering sciences reports, Kyushu University","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2011-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Engineering sciences reports, Kyushu University","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15017/19574","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
m was investigated using the helicoid spring specimen technique. The testing temperatures ranged from 423 K to 523 K (0.47 to 0.58 Tm) and the applied stresses from 0.20 to . It was found that under the above conditions, viscous creep of Bingham type occurs, characterized by a threshold stress which decreases with increasing temperature. The activation energy is Qc = 44 7 kJ/mol. No microstructural changes were observed in recrystallized and the as-crept specimens. The measured creep rates were found to be four orders faster than that predicted by Coble creep model.