L. Nykyrui, Y. Saliy, R. Yavorskyi, Ya. Yavorskyi, V. Schenderovsky, G. Wisz, Sz. Górny
{"title":"CdTe vapor phase condensates on (100) Si and glass for solar cells","authors":"L. Nykyrui, Y. Saliy, R. Yavorskyi, Ya. Yavorskyi, V. Schenderovsky, G. Wisz, Sz. Górny","doi":"10.1109/NAP.2017.8190161","DOIUrl":null,"url":null,"abstract":"The structural and chemical properties of Cadmium Telluride (CdTe) thin films received at different technology conditions were investigated. Thin films of CdTe were grown on Silicon (100) and glass substrates using by vapor phase condensation method. Morphological properties of the thin film surface and the cross section were investigated by scanning electron and atomic force microscopies. A cross section study has shown the columnar-type of grown of the CdTe thin films. The chemical composition of the obtained films was investigated by SEM using the method of Energy-dispersive X-ray spectroscopy (EDX). The thickness of samples was analysis using the profilometer Bruker Dektak XT.","PeriodicalId":6516,"journal":{"name":"2017 IEEE 7th International Conference Nanomaterials: Application & Properties (NAP)","volume":"47 1","pages":"01PCSI26-1-01PCSI26-5"},"PeriodicalIF":0.0000,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE 7th International Conference Nanomaterials: Application & Properties (NAP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAP.2017.8190161","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
The structural and chemical properties of Cadmium Telluride (CdTe) thin films received at different technology conditions were investigated. Thin films of CdTe were grown on Silicon (100) and glass substrates using by vapor phase condensation method. Morphological properties of the thin film surface and the cross section were investigated by scanning electron and atomic force microscopies. A cross section study has shown the columnar-type of grown of the CdTe thin films. The chemical composition of the obtained films was investigated by SEM using the method of Energy-dispersive X-ray spectroscopy (EDX). The thickness of samples was analysis using the profilometer Bruker Dektak XT.
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