M. Doutre, A. Freeman, B. Diak, A. Murray, G. Bevan, L. Fuster-López
{"title":"Fine Pore Structure Characterization in Two Gessoes Using Focused Ion Bean Scanning","authors":"M. Doutre, A. Freeman, B. Diak, A. Murray, G. Bevan, L. Fuster-López","doi":"10.1557/OPL.2014.826","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18884,"journal":{"name":"MRS Proceedings","volume":"408 1","pages":"157-165"},"PeriodicalIF":0.0000,"publicationDate":"2017-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"MRS Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1557/OPL.2014.826","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
