{"title":"Progress toward developing a novel module architecture for increased reliability and reduced costs","authors":"K. Barth, Davis Hemenway","doi":"10.1109/PVSC.2014.6925483","DOIUrl":null,"url":null,"abstract":"Module reliability has a direct impact on the levalized cost of energy, and reliability issues for thin film PV have been consistently reported. Direct Solar LLC is developing a new module architecture for thin film PV that has robustness to moisture and excellent adhesion under UV light exposure. Process cycle times for each manufacturing step is under 1 minute using low capital cost, small footprint tooling. The patent pending architecture utilizes a specialized two part edge seal. The modules are fabricated without lamination, vacuum pressing or module heating. An initial version of this design has passed IEC 61646 and UL 1703 certification tests and 4500+hrs. of the rigorous 85 C/85% relative humidity “damp heat test”.","PeriodicalId":6649,"journal":{"name":"2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)","volume":"1 1","pages":"0166-0169"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE 40th Photovoltaic Specialist Conference (PVSC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PVSC.2014.6925483","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Module reliability has a direct impact on the levalized cost of energy, and reliability issues for thin film PV have been consistently reported. Direct Solar LLC is developing a new module architecture for thin film PV that has robustness to moisture and excellent adhesion under UV light exposure. Process cycle times for each manufacturing step is under 1 minute using low capital cost, small footprint tooling. The patent pending architecture utilizes a specialized two part edge seal. The modules are fabricated without lamination, vacuum pressing or module heating. An initial version of this design has passed IEC 61646 and UL 1703 certification tests and 4500+hrs. of the rigorous 85 C/85% relative humidity “damp heat test”.
组件的可靠性直接影响能源的平化成本,而薄膜光伏的可靠性问题一直被报道。Direct Solar LLC正在开发一种新的薄膜光伏组件架构,该组件具有抗湿性和紫外线照射下的优异附着力。每个制造步骤的工艺周期时间在1分钟以下,使用低资本成本,小足迹的工具。正在申请专利的架构采用专门的两部分边缘密封。该模块的制造无需层压,真空压制或模块加热。该设计的初始版本已通过IEC 61646和UL 1703认证测试和4500+小时。严格的85℃/85%相对湿度“湿热试验”。