An Aluminum Nano-Spike electroporation chip for low voltage delivery of molecules to cancer cells

K. Riaz, S. Leung, S. Tripathi, Gursimran Singh Sethi, H. Shagoshtasbi, Z. Fan, Y.-K. Lee
{"title":"An Aluminum Nano-Spike electroporation chip for low voltage delivery of molecules to cancer cells","authors":"K. Riaz, S. Leung, S. Tripathi, Gursimran Singh Sethi, H. Shagoshtasbi, Z. Fan, Y.-K. Lee","doi":"10.1109/NEMS.2014.6908779","DOIUrl":null,"url":null,"abstract":"Micro electroporation (EP) devices with high efficiency and cell viability are useful for various biomedical applications, such as drug delivery and screening. However, these devices usually have low reliability due to undesirable electrochemical reactions. In this study, an Aluminum Nano-Spike EP (ANS-EP) chip was fabricated using nano-imprint lithography, electrochemical anodization and MEMS technology. The fabricated device was characterized using cervical cancer cell line (HeLa cells). The EP efficiency and cell viability as functions of electric pulse amplitude and duration were measured using digital fluorescent microscopy with Propidium Iodide (PI) dye. Numerical simulations of electric field strength indicated enhanced localized electric field at the tip due to high aspect ratio of nano-spikes. Systematic experiments revealed EP can be achieved with high efficiency and cell viability using ANS-EP chips without bubble generation at the critical applied voltage of 2.5 V, much smaller than the micro and conventional electroporators.","PeriodicalId":22566,"journal":{"name":"The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)","volume":"12 1","pages":"147-151"},"PeriodicalIF":0.0000,"publicationDate":"2014-04-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"The 9th IEEE International Conference on Nano/Micro Engineered and Molecular Systems (NEMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NEMS.2014.6908779","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

Micro electroporation (EP) devices with high efficiency and cell viability are useful for various biomedical applications, such as drug delivery and screening. However, these devices usually have low reliability due to undesirable electrochemical reactions. In this study, an Aluminum Nano-Spike EP (ANS-EP) chip was fabricated using nano-imprint lithography, electrochemical anodization and MEMS technology. The fabricated device was characterized using cervical cancer cell line (HeLa cells). The EP efficiency and cell viability as functions of electric pulse amplitude and duration were measured using digital fluorescent microscopy with Propidium Iodide (PI) dye. Numerical simulations of electric field strength indicated enhanced localized electric field at the tip due to high aspect ratio of nano-spikes. Systematic experiments revealed EP can be achieved with high efficiency and cell viability using ANS-EP chips without bubble generation at the critical applied voltage of 2.5 V, much smaller than the micro and conventional electroporators.
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一种用于向癌细胞低压输送分子的铝纳米尖刺电穿孔芯片
微电穿孔(EP)装置具有高效率和细胞活力,可用于各种生物医学应用,如药物输送和筛选。然而,由于不良的电化学反应,这些装置通常具有较低的可靠性。本研究采用纳米压印、电化学阳极氧化和MEMS技术制备了一种铝纳米尖峰电位(ANS-EP)芯片。用宫颈癌细胞系(HeLa细胞)对该装置进行了表征。采用数字荧光显微镜,用碘化丙啶(PI)染料测定了EP效率和细胞活力随电脉冲幅度和持续时间的变化。电场强度的数值模拟表明,由于纳米尖峰的高长径比,尖尖处的局部电场增强。系统实验表明,在2.5 V的临界电压下,使用ANS-EP芯片可以实现高效的电穿孔,且不产生气泡,比微型和传统电穿孔器小得多。
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