Development of catalytic etching using dual materials

Mao-Jung Huang, N. Chu, Chun-Ming Chang, M. Shiao, C. Hsiao
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Abstract

In this study we presents an effective and simple process for forming multi-level vertical structures on a (100) silicon wafer. The dual materials including gold and platinum was employed as catalytic material in the etching process. We employed an etchant solution consisting of 4.6 M hydrofluoric acid, 0.44 M hydrogen peroxide, and isopropyl alcohol to produce microstructures at an etching rate of 0.294 μm/min and 0.648 μm/min during only gold (Au) and platinum (Pt) film, respectively. For the catalytic etching process with 10 nm-thick Au and Pt, the etching rate yield from Au film was increased to that generated from the etching process with single Pt film. In the meantime, the etching structure under Pt film became not obvious in the dual materials etching process. For the sample with 10 nm Au and 11 nm Pt, the significant etching produced on both Au and Pt region.
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双材料催化蚀刻技术的发展
在这项研究中,我们提出了一种在(100)硅片上形成多层垂直结构的有效而简单的工艺。在蚀刻过程中,采用金和铂双材料作为催化材料。采用由4.6 M氢氟酸、0.44 M过氧化氢和异丙醇组成的蚀刻液,仅在金(Au)和铂(Pt)薄膜上分别以0.294 μm/min和0.648 μm/min的蚀刻速率生成微结构。对于10 nm厚Au和Pt的催化蚀刻工艺,Au膜的蚀刻速率产率提高到单Pt膜的蚀刻速率产率。同时,在双材料刻蚀过程中,Pt薄膜下的刻蚀结构变得不明显。对于10 nm Au和11 nm Pt的样品,在Au和Pt区域都产生了明显的蚀刻。
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