J. Cuper, M. Rytel, T. Karpisz, A. Pacewicz, B. Salski, P. Kopyt
{"title":"Ka-band Compact Scalar Network Analyzer Dedicated to Resonator-based Measurements of Material Properties","authors":"J. Cuper, M. Rytel, T. Karpisz, A. Pacewicz, B. Salski, P. Kopyt","doi":"10.1109/mwsym.2019.8700922","DOIUrl":null,"url":null,"abstract":"The paper describes two test setups allowing one to measure over the Ka-band the scalar transmission coefficient of a state-of-the-art high-Q Fabry-Pérot open resonators that are often used for measurement of properties of low-loss materials. Both setups described herein employ readily-available components. Their performance is verified against measurements performed using a laboratory-grade vector network analyzer for two exemplary material samples and agreement is found, which demonstrates that an effective Ka-band material properties measurement system can be realized also without high-end laboratory equipment.","PeriodicalId":6720,"journal":{"name":"2019 IEEE MTT-S International Microwave Symposium (IMS)","volume":"38 1","pages":"51-54"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 IEEE MTT-S International Microwave Symposium (IMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/mwsym.2019.8700922","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The paper describes two test setups allowing one to measure over the Ka-band the scalar transmission coefficient of a state-of-the-art high-Q Fabry-Pérot open resonators that are often used for measurement of properties of low-loss materials. Both setups described herein employ readily-available components. Their performance is verified against measurements performed using a laboratory-grade vector network analyzer for two exemplary material samples and agreement is found, which demonstrates that an effective Ka-band material properties measurement system can be realized also without high-end laboratory equipment.