Enhancing Quality and Security of the PLL-TRNG

V. Fischer, F. Bernard, Nathalie Bochard, Quentin Dallison, M. Skorski
{"title":"Enhancing Quality and Security of the PLL-TRNG","authors":"V. Fischer, F. Bernard, Nathalie Bochard, Quentin Dallison, M. Skorski","doi":"10.46586/tches.v2023.i4.211-237","DOIUrl":null,"url":null,"abstract":"Field Programmable Gate Arrays (FPGAs) are used more and more frequently to implement cryptographic systems, which need random number generators (RNGs) to be embedded in the same device. The main challenge related to the implementation of a generator running inside FPGAs is that the physical source of randomness, such as jittered clock generator, is implemented in the configurable logic area, i.e. in the close vicinity of noisy running algorithms, which can have significant impact on generated numbers or even serve to attack the generator. A possible approach to prevent such influence is the use of Phase-Lock Loops (PLLs), which are separated from the re-configurable logic area inside the FPGA chip. In this paper, we propose a new architecture of the PLL-based TRNG including a method to avoid correlation in the output through control of timing in the sampling process, as well as new embedded tests based on the enhanced stochastic model. We also propose a workflow to help find the best parameters, such as output bitrate and entropy rate. We show that bitrates of around 400 kb/s or more can be achieved, while guaranteeing min-entropy rates per bit higher than 0.98 as required by the latest security standards.","PeriodicalId":13186,"journal":{"name":"IACR Trans. Cryptogr. Hardw. Embed. Syst.","volume":"109 1","pages":"211-237"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IACR Trans. Cryptogr. Hardw. Embed. Syst.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.46586/tches.v2023.i4.211-237","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

Field Programmable Gate Arrays (FPGAs) are used more and more frequently to implement cryptographic systems, which need random number generators (RNGs) to be embedded in the same device. The main challenge related to the implementation of a generator running inside FPGAs is that the physical source of randomness, such as jittered clock generator, is implemented in the configurable logic area, i.e. in the close vicinity of noisy running algorithms, which can have significant impact on generated numbers or even serve to attack the generator. A possible approach to prevent such influence is the use of Phase-Lock Loops (PLLs), which are separated from the re-configurable logic area inside the FPGA chip. In this paper, we propose a new architecture of the PLL-based TRNG including a method to avoid correlation in the output through control of timing in the sampling process, as well as new embedded tests based on the enhanced stochastic model. We also propose a workflow to help find the best parameters, such as output bitrate and entropy rate. We show that bitrates of around 400 kb/s or more can be achieved, while guaranteeing min-entropy rates per bit higher than 0.98 as required by the latest security standards.
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提高PLL-TRNG的质量和安全性
现场可编程门阵列(fpga)越来越多地用于实现加密系统,这需要在同一设备中嵌入随机数生成器(rng)。实现在fpga内部运行的生成器所面临的主要挑战是,随机性的物理来源,如抖动时钟生成器,是在可配置逻辑区域中实现的,即在噪声运行算法的附近,这可能对生成的数字产生重大影响,甚至可以攻击生成器。防止这种影响的一种可能方法是使用锁相环(pll),它与FPGA芯片内的可重新配置逻辑区域分开。在本文中,我们提出了一种新的基于锁相环的TRNG结构,包括一种通过控制采样过程中的时序来避免输出相关性的方法,以及基于增强随机模型的新的嵌入式测试。我们还提出了一个工作流来帮助找到最佳参数,如输出比特率和熵率。我们表明,可以实现大约400kb /s或更高的比特率,同时保证最新安全标准要求的每比特最小熵率高于0.98。
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