A low noise readout detector circuit for nano-ampere sensor applications

D. Thelen, D. D. Chu
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引用次数: 9

Abstract

A readout detector integrated circuit (IC) has been developed which is capable of detecting nano-ampere photo-current signals of interest in a high (micro-ampere) background illumination or DC noise level (SNR=92 dB). The readout detector sensor IC processes transient signals of interest from a separate photodiode pixel array chip. Low noise signal conditioning, filtering, and signal thresholding implement smart sensor detection of only "active pixels". This detector circuit can also be used to perform signal conditioning for other sensor applications that require detection of very small signals in a high background noise environment.
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用于纳米安培传感器的低噪声读出检测器电路
本文开发了一种读出检测器集成电路,能够在高(微安培)背景照明或直流噪声水平(信噪比=92 dB)下检测感兴趣的纳安培光电流信号。读出检测器传感器IC处理来自单独光电二极管像素阵列芯片的感兴趣的瞬态信号。低噪声信号调理、滤波和信号阈值处理实现了仅对“活动像素”的智能传感器检测。该检测器电路也可用于执行信号调理的其他传感器应用,需要在高背景噪声环境中检测非常小的信号。
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3.80
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