{"title":"Determination of Trap Concentrations and Energy Levels in Insulators and Semiconductors from Steady-State Space-Charge-Limited Currents","authors":"J. Heebice, V. Čech, A. Brablec","doi":"10.1515/9783112480823-020","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":18217,"journal":{"name":"March 16","volume":"1 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"1988-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"March 16","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1515/9783112480823-020","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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