Piezoelectric Scanning Micromirror with Large Scan Angle Based on Thin Film Aluminum Nitride

Katja Meinel, C. Stoeckel, M. Melzer, S. Zimmermann, R. Forke, K. Hiller, T. Otto
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引用次数: 10

Abstract

In this paper micromirrors based on piezoelectric thin film aluminum nitride (AlN) are presented. The microsystems with a 6 mm² footprint are fabricated successfully in 150 mm SOI technology. A large tilt angle is achieved by FEM-based optimization of the lever arm parameters. Three micromirror types with varied spring widths are characterized, achieving tilt angles up to 51.3° at 1.9 kHz, 31.6° at 4.6 kHz, and 16.5° at 12.5 kHz for an actuation voltage of less than 5 V. For higher actuation voltages up to 20 V, a maximum scan angle of 104.9° is reached, limited by the measurement setup.
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基于氮化铝薄膜的大扫描角压电微镜
本文提出了一种基于压电薄膜氮化铝(AlN)的微镜。采用150mm SOI技术成功制备了占地面积为6mm²的微系统。通过有限元法优化杆臂参数,实现了较大的倾斜角度。具有不同弹簧宽度的三种微镜类型的特征,在小于5 V的驱动电压下,在1.9 kHz时可达到51.3°,4.6 kHz时可达到31.6°,12.5 kHz时可达到16.5°。对于高达20 V的较高驱动电压,受测量设置的限制,最大扫描角达到104.9°。
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