{"title":"Model checks for two-sample location-scale","authors":"Atefeh Javidialsaadi, Shoubhik Mondal, Sundarraman Subramanian","doi":"10.1080/10485252.2023.2243350","DOIUrl":null,"url":null,"abstract":"MODEL CHECKS FOR TWO-SAMPLE LOCATION-SCALE by Atefeh Javidialsaadi Two-sample location-scale refers to a model that permits a pair of standardized random variables to have a common distribution. This means that if X1 and X2 are two random variables with means μ1 and μ2 and standard deviations σ1 and σ2, then (X1−μ1)/σ1 and (X2−μ2)/σ2 have some common unspecified standard or base distribution F0. Function-based hypothesis testing for these models refers to formal tests that would help determine whether or not two samples may have come from some location-scale family of distributions, without specifying the standard distribution F0. For uncensored data, Hall et al. (2013) proposed a test based on empirical characteristic functions (ECFs), but it can not be directly applied for censored data. Empirical likelihood with minimum distance (MD) plug-ins provides an alternative to the approach based on ECFs (Subramanian, 2020). However, when working with standardized data, it appeared feasible to set up plug-in empirical likelihood (PEL) with estimated means and standard deviations as plug-ins, which avoids MD estimation of location and scale parameters and (hence) quantile estimation. This project addresses two issues: (i) Set up a PEL founded testing procedure that uses sample means and standard deviations as the plug-ins for uncensored case, and Kaplan–Meier integral based estimators as plug-ins for censored case, (ii) Extend the ECF test to accommodate censoring. Large sample null distributions of the proposed test statistics are derived. Numerical studies are carried out to investigate the performance of the proposed methods. Real examples are also presented for both the uncensored and censored cases. MODEL CHECKS FOR TWO-SAMPLE LOCATION-SCALE by Atefeh Javidialsaadi A Dissertation Submitted to the Faculty of New Jersey Institute of Technology and Rutgers, The State University of New Jersey – Newark in Partial Fulfillment of the Requirements for the Degree of Doctor of Philosophy in Mathematical Sciences Department of Mathematical Sciences Department of Mathematics and Computer Science, Rutgers-Newark","PeriodicalId":50112,"journal":{"name":"Journal of Nonparametric Statistics","volume":"33 1","pages":""},"PeriodicalIF":0.8000,"publicationDate":"2023-08-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Nonparametric Statistics","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1080/10485252.2023.2243350","RegionNum":4,"RegionCategory":"数学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"STATISTICS & PROBABILITY","Score":null,"Total":0}
引用次数: 0
Abstract
MODEL CHECKS FOR TWO-SAMPLE LOCATION-SCALE by Atefeh Javidialsaadi Two-sample location-scale refers to a model that permits a pair of standardized random variables to have a common distribution. This means that if X1 and X2 are two random variables with means μ1 and μ2 and standard deviations σ1 and σ2, then (X1−μ1)/σ1 and (X2−μ2)/σ2 have some common unspecified standard or base distribution F0. Function-based hypothesis testing for these models refers to formal tests that would help determine whether or not two samples may have come from some location-scale family of distributions, without specifying the standard distribution F0. For uncensored data, Hall et al. (2013) proposed a test based on empirical characteristic functions (ECFs), but it can not be directly applied for censored data. Empirical likelihood with minimum distance (MD) plug-ins provides an alternative to the approach based on ECFs (Subramanian, 2020). However, when working with standardized data, it appeared feasible to set up plug-in empirical likelihood (PEL) with estimated means and standard deviations as plug-ins, which avoids MD estimation of location and scale parameters and (hence) quantile estimation. This project addresses two issues: (i) Set up a PEL founded testing procedure that uses sample means and standard deviations as the plug-ins for uncensored case, and Kaplan–Meier integral based estimators as plug-ins for censored case, (ii) Extend the ECF test to accommodate censoring. Large sample null distributions of the proposed test statistics are derived. Numerical studies are carried out to investigate the performance of the proposed methods. Real examples are also presented for both the uncensored and censored cases. MODEL CHECKS FOR TWO-SAMPLE LOCATION-SCALE by Atefeh Javidialsaadi A Dissertation Submitted to the Faculty of New Jersey Institute of Technology and Rutgers, The State University of New Jersey – Newark in Partial Fulfillment of the Requirements for the Degree of Doctor of Philosophy in Mathematical Sciences Department of Mathematical Sciences Department of Mathematics and Computer Science, Rutgers-Newark
期刊介绍:
Journal of Nonparametric Statistics provides a medium for the publication of research and survey work in nonparametric statistics and related areas. The scope includes, but is not limited to the following topics:
Nonparametric modeling,
Nonparametric function estimation,
Rank and other robust and distribution-free procedures,
Resampling methods,
Lack-of-fit testing,
Multivariate analysis,
Inference with high-dimensional data,
Dimension reduction and variable selection,
Methods for errors in variables, missing, censored, and other incomplete data structures,
Inference of stochastic processes,
Sample surveys,
Time series analysis,
Longitudinal and functional data analysis,
Nonparametric Bayes methods and decision procedures,
Semiparametric models and procedures,
Statistical methods for imaging and tomography,
Statistical inverse problems,
Financial statistics and econometrics,
Bioinformatics and comparative genomics,
Statistical algorithms and machine learning.
Both the theory and applications of nonparametric statistics are covered in the journal. Research applying nonparametric methods to medicine, engineering, technology, science and humanities is welcomed, provided the novelty and quality level are of the highest order.
Authors are encouraged to submit supplementary technical arguments, computer code, data analysed in the paper or any additional information for online publication along with the published paper.