Review on the elemental analysis of polymetallic deposits by total-reflection X-ray fluorescence spectrometry

IF 5.4 2区化学 Q1 INSTRUMENTS & INSTRUMENTATION Applied Spectroscopy Reviews Pub Date : 2022-10-13 DOI:10.1080/05704928.2022.2130350

Yongsheng Zhang, Yaxiong He, W. Zhou, Guanqin Mo, Hui Chen, Tao Xu

{"title":"Review on the elemental analysis of polymetallic deposits by total-reflection X-ray fluorescence spectrometry","authors":"Yongsheng Zhang, Yaxiong He, W. Zhou, Guanqin Mo, Hui Chen, Tao Xu","doi":"10.1080/05704928.2022.2130350","DOIUrl":null,"url":null,"abstract":"Abstract Total reflection X-ray fluorescence (TXRF) has been widely considered as an effective analytical tool for the analysis of a great variety type of polymetallic deposits, because it has many advantages of extremely high sensitivity, high accuracy, minor sample preparation, and the ability of multielement simultaneous analysis. Sample preparation is quite important for TXRF quantitative analysis. Since pretreatment factors, such as sample amount, dispersant type, sample particle size and sample physicochemical properties, are seriously impact the accuracy of results. Based on this reason, investigating an appropriate sample pretreatment strategy is fundamental for accurate assessment of strategic metal elements in polymetallic deposits. This review presents a comprehensive overview of TXRF applications in the field of mineral analysis, including apatite, manganese ore, K-feldspars, granite, copper-nickel sulfide ore, etc. Moreover, the accurate evaluation of TXRF quantitative analysis is detailedly discussed, and the relevant sample preparation methods and preparation factors are also addressed.","PeriodicalId":8100,"journal":{"name":"Applied Spectroscopy Reviews","volume":"100 1","pages":"428 - 441"},"PeriodicalIF":5.4000,"publicationDate":"2022-10-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Spectroscopy Reviews","FirstCategoryId":"92","ListUrlMain":"https://doi.org/10.1080/05704928.2022.2130350","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}

引用次数: 2

Abstract

Abstract Total reflection X-ray fluorescence (TXRF) has been widely considered as an effective analytical tool for the analysis of a great variety type of polymetallic deposits, because it has many advantages of extremely high sensitivity, high accuracy, minor sample preparation, and the ability of multielement simultaneous analysis. Sample preparation is quite important for TXRF quantitative analysis. Since pretreatment factors, such as sample amount, dispersant type, sample particle size and sample physicochemical properties, are seriously impact the accuracy of results. Based on this reason, investigating an appropriate sample pretreatment strategy is fundamental for accurate assessment of strategic metal elements in polymetallic deposits. This review presents a comprehensive overview of TXRF applications in the field of mineral analysis, including apatite, manganese ore, K-feldspars, granite, copper-nickel sulfide ore, etc. Moreover, the accurate evaluation of TXRF quantitative analysis is detailedly discussed, and the relevant sample preparation methods and preparation factors are also addressed.

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x射线全反射荧光光谱法分析多金属矿床元素的研究进展

摘要全反射x射线荧光(TXRF)由于具有极高的灵敏度、高精度、样品制备量少、多元素同时分析能力等优点，已被广泛认为是分析多种类型多金属矿床的有效分析工具。样品制备是TXRF定量分析的重要环节。由于样品用量、分散剂类型、样品粒度、样品理化性质等预处理因素严重影响结果的准确性。因此，研究合适的样品前处理策略是准确评价多金属矿床中战略金属元素的基础。本文综述了TXRF在磷灰石、锰矿石、钾长石、花岗岩、铜镍硫化矿等矿物分析领域的应用。详细讨论了TXRF定量分析的准确性评价，并对相关的制样方法和制备因素进行了讨论。

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来源期刊

Applied Spectroscopy Reviews 工程技术-光谱学

CiteScore

13.80

自引率

1.60%

发文量

审稿时长

1 months

期刊介绍： Applied Spectroscopy Reviews provides the latest information on the principles, methods, and applications of all the diverse branches of spectroscopy, from X-ray, infrared, Raman, atomic absorption, and ESR to microwave, mass, NQR, NMR, and ICP. This international, single-source journal presents discussions that relate physical concepts to chemical applications for chemists, physicists, and other scientists using spectroscopic techniques.