A fully-functional 90nm 8Mb STT MRAM demonstrator featuring trimmed, reference cell-based sensing

J. DeBrosse, T. Maffitt, Yutaka Nakamura, G. Jan, P. Wang
{"title":"A fully-functional 90nm 8Mb STT MRAM demonstrator featuring trimmed, reference cell-based sensing","authors":"J. DeBrosse, T. Maffitt, Yutaka Nakamura, G. Jan, P. Wang","doi":"10.1109/CICC.2015.7338359","DOIUrl":null,"url":null,"abstract":"Spin Transfer Torque Magnetoresistive RAM (STT MRAM) has uniquely attractive write performance and endurance characteristics. Nonetheless, little STT MRAM circuit hardware data has been published [1-4]. This paper describes a fully-functional 90nm 8Mb STT MRAM, identifies and describes solutions to the primary circuit challenges, and includes considerable circuit hardware data.","PeriodicalId":6665,"journal":{"name":"2015 IEEE Custom Integrated Circuits Conference (CICC)","volume":"237 1","pages":"1-3"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Custom Integrated Circuits Conference (CICC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2015.7338359","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

Spin Transfer Torque Magnetoresistive RAM (STT MRAM) has uniquely attractive write performance and endurance characteristics. Nonetheless, little STT MRAM circuit hardware data has been published [1-4]. This paper describes a fully-functional 90nm 8Mb STT MRAM, identifies and describes solutions to the primary circuit challenges, and includes considerable circuit hardware data.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
一个功能齐全的90nm 8Mb STT MRAM演示器,具有修剪的参考细胞传感
自旋传递转矩磁阻RAM (STT MRAM)具有独特的写入性能和持久性能。然而,很少有STT MRAM电路硬件数据发表[1-4]。本文描述了一个功能齐全的90nm 8Mb STT MRAM,确定并描述了主要电路挑战的解决方案,并包括大量的电路硬件数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A 150nA IQ, 850mA ILOAD, 90% Efficiency over 10μA to 400mA Loading Range Introduction to Compute-in-Memory Portable and Scalable High Voltage Circuits for Automotive Applications in BiCMOS Processes ADC-based Wireline Transceiver Session 27 - Technology directions
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1