{"title":"Theory of a defect-tolerant dielectric system","authors":"S. Boggs","doi":"10.1109/14.236211","DOIUrl":null,"url":null,"abstract":"The properties of a dielectric for which the resistivity is an exponential function of electric field are examined. It is shown that such a dielectric exhibits a limiting electric field when applied to an AC system. The thermal characteristics of a small conducting stress enhancement in this system are examined to demonstrate thermal stability for power frequency applications. >","PeriodicalId":13105,"journal":{"name":"IEEE Transactions on Electrical Insulation","volume":"9 1","pages":"365-371"},"PeriodicalIF":0.0000,"publicationDate":"1993-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"24","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electrical Insulation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/14.236211","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 24
Abstract
The properties of a dielectric for which the resistivity is an exponential function of electric field are examined. It is shown that such a dielectric exhibits a limiting electric field when applied to an AC system. The thermal characteristics of a small conducting stress enhancement in this system are examined to demonstrate thermal stability for power frequency applications. >
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