Dark current analysis of P-type and N-type pixels under total ionizing dose radiation effects

R. Zheng, Jia Wang
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Abstract

In this paper, a custom-designed CMOS image sensor (CIS) is proposed with N-type and P-type pixels fabricated on one chip. A Co radiation experiment is implemented on the proposed CIS chip. Measurement results shows that the P-type pixels have good total ionizing dose (TID) radiation tolerance with less radiation induced dark current compared with N-type pixels. But the dark current nonuniformity of P-type pixels is observed to be enhanced more than N-type ones by TID radiation effect.
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总电离剂量辐射效应下p型和n型像元的暗电流分析
本文提出了一种基于n型和p型像素的定制CMOS图像传感器(CIS)。在所提出的CIS芯片上进行了Co辐射实验。测量结果表明,与n型像元相比,p型像元具有较好的总电离剂量(TID)辐射耐受性,且辐射诱导暗电流较小。但在TID辐射作用下,p型像元的暗电流不均匀性明显强于n型像元。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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