J. Warnock, L. Sigal, D. Wendel, K. Muller, J. Friedrich, V. Zyuban, E. Cannon, A. KleinOsowski
{"title":"POWER7TM local clocking and clocked storage elements","authors":"J. Warnock, L. Sigal, D. Wendel, K. Muller, J. Friedrich, V. Zyuban, E. Cannon, A. KleinOsowski","doi":"10.1109/ISSCC.2010.5433995","DOIUrl":null,"url":null,"abstract":"The design of the clocked storage elements (CSEs) and associated local clocking circuitry is a critical consideration for modern microprocessor projects[1], and the POWER7™ chip[2], designed in a 45nm silicon-on-insulator (SOI) technology, was no exception. The digital logic contained over 2M CSEs, and the design of these elements had a major impact not only on the area, power, and performance of the chip, but also on the reliability, testability, and the ability to debug and optimize the hardware. This paper will focus on the special features added to the CSE design with these considerations in mind.","PeriodicalId":6418,"journal":{"name":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2010-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Solid-State Circuits Conference - (ISSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2010.5433995","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 26
Abstract
The design of the clocked storage elements (CSEs) and associated local clocking circuitry is a critical consideration for modern microprocessor projects[1], and the POWER7™ chip[2], designed in a 45nm silicon-on-insulator (SOI) technology, was no exception. The digital logic contained over 2M CSEs, and the design of these elements had a major impact not only on the area, power, and performance of the chip, but also on the reliability, testability, and the ability to debug and optimize the hardware. This paper will focus on the special features added to the CSE design with these considerations in mind.
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