Theoretical Verification of Formula for Charge Function in Time q = c * v in RC Circuit for Charging/Discharging of Fractional & Ideal Capacitor

S. Das
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引用次数: 1

Abstract

Objective of this paper is verification of newly developed formula of charge storage in capacitor as   q = c*v, in RC circuit, to get validation for ideal loss less capacitor as well as fractional order capacitors for charging and discharging cases. This new formula is different to usual and conventional way of writing capacitance multiplied by voltage to get charge stored in a capacitor   i.e. q = cv. We use this new formulation i.e.   q = c*v in RC circuits to verify the results that are obtained via classical circuit theory, for a case of classical loss less capacitor as well as fractional capacitor. The use of this formulation is suited for super-capacitors, as they show fractional order in their behavior. This new formula is used to get the ‘memory effect’ that is observed in self-discharging phenomena of super-capacitors-that memorizes its history of charging profile. Special emphasis is given to detailed derivational steps in order to clarity in usage of this new formula in the RC circuit examples. This paper validates  the new formula of   charge   storage  in  capacitor i.e. q = c*v.
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分数型理想电容器充放电RC电路中q = c * v时间电荷函数公式的理论验证
本文的目的是在RC电路中验证新开发的电容器电荷存储公式q = c*v,以验证理想的低损耗电容器和分数阶电容器在充放电情况下的有效性。这个新公式不同于通常和传统的写电容乘以电压的方法,即q = cv。我们在RC电路中使用这个新的公式,即q = c*v,来验证经典电路理论得到的结果,对于经典少损耗电容器和分数电容的情况。这种公式的使用适合于超级电容器,因为它们的行为表现出分数阶。这个新公式用于获得超级电容器自放电现象中观察到的“记忆效应”,即记忆其充电曲线的历史。特别强调了详细的推导步骤,以便在RC电路实例中清楚地使用这个新公式。本文验证了电容电荷存储的新公式q = c*v。
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