Rietveld texture analysis from diffraction images

L. Lutterotti, M. Bortolotti, G. Ischia, I. Lonardelli, H. Wenk
{"title":"Rietveld texture analysis from diffraction images","authors":"L. Lutterotti, M. Bortolotti, G. Ischia, I. Lonardelli, H. Wenk","doi":"10.1524/ZKSU.2007.2007.SUPPL_26.125","DOIUrl":null,"url":null,"abstract":"The procedure to perform Rietveld texture analysis from diffraction images collected with CCDs or image plates is shown. In some cases only one transmission image may be sufficient to obtain an Orientation Distribution Function (ODF) if a sufficient number of peaks are included. The images are transformed in spectra and analyzed using the Maud Rietveld program containing some recently developed texture model well suited for this kind of analysis. In this work we will present the results obtained using a custom laboratory image plate camera developed for texture analysis. The instrument may work with a curve image plate detector in reflection condition or with a flat detector in transmission. The reflection condition is used mainly for ceramics and metal-alloys and the transmission mode for polymers and fibres. We will show how with the combination of such camera and the Rietveld Texture Analysis method we were able to analyze the ODF of the martensitic phase of Shape Memory Alloy (monoclinic NiTi SMA) as well as to obtain the quantitative texture of low symmetry polymers in fibre form.","PeriodicalId":23897,"journal":{"name":"Zeitschrift Fur Kristallographie","volume":"2007 1","pages":"125-130"},"PeriodicalIF":0.0000,"publicationDate":"2007-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"393","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Zeitschrift Fur Kristallographie","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1524/ZKSU.2007.2007.SUPPL_26.125","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"Chemistry","Score":null,"Total":0}
引用次数: 393

Abstract

The procedure to perform Rietveld texture analysis from diffraction images collected with CCDs or image plates is shown. In some cases only one transmission image may be sufficient to obtain an Orientation Distribution Function (ODF) if a sufficient number of peaks are included. The images are transformed in spectra and analyzed using the Maud Rietveld program containing some recently developed texture model well suited for this kind of analysis. In this work we will present the results obtained using a custom laboratory image plate camera developed for texture analysis. The instrument may work with a curve image plate detector in reflection condition or with a flat detector in transmission. The reflection condition is used mainly for ceramics and metal-alloys and the transmission mode for polymers and fibres. We will show how with the combination of such camera and the Rietveld Texture Analysis method we were able to analyze the ODF of the martensitic phase of Shape Memory Alloy (monoclinic NiTi SMA) as well as to obtain the quantitative texture of low symmetry polymers in fibre form.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
衍射图像的Rietveld纹理分析
显示了用ccd或图像板收集的衍射图像进行里特维尔德纹理分析的程序。在某些情况下,如果包含足够数量的峰值,则仅一个传输图像可能足以获得方向分布函数(ODF)。对图像进行光谱变换,并使用Maud Rietveld程序进行分析,该程序包含一些最近开发的非常适合这种分析的纹理模型。在这项工作中,我们将介绍使用用于纹理分析的定制实验室图像板相机获得的结果。该仪器可以在反射条件下与曲线像板探测器一起工作,也可以在透射条件下与平面探测器一起工作。反射条件主要用于陶瓷和金属合金,透射模式用于聚合物和纤维。我们将展示如何结合这种相机和Rietveld织构分析方法,我们能够分析形状记忆合金(单斜NiTi SMA)的马氏体相的ODF,以及获得纤维形式的低对称性聚合物的定量织构。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
CiteScore
1.47
自引率
0.00%
发文量
0
审稿时长
3 months
期刊介绍: Zeitschrift für Kristallographie International journal for structural, physical, and chemical aspects of crystalline materials ISSN 0044-2968 Founded in 1877 by Paul Groth Zeitschrift für Kristallographie is one of the world’s oldest scientific journals. In original papers, letters and review articles it presents results of theoretical or experimental study on crystallography.
期刊最新文献
POWGEN: a third-generation high resolution high-throughput powder diffraction instrument at the Spallation Neutron Source Diffraction contrast factor of dislocations: The case of scheelite CaWO4 Nanocrystalline MgO powder materials prepared by sol-gel studied by X-ray diffraction and electron microscopy Macromolecular powder diffraction : structure solution via molecular. Interdiffusion and stress development in Ni-Cu thin film diffusion couples
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1