Shumin Zhang, Zhanshan Wang, Zhengxiang Shen, Wenjuan Wu, Long Chen
{"title":"Combination of Surface Characterization Techniques for Analyzing the Roughness of the Substrate","authors":"Shumin Zhang, Zhanshan Wang, Zhengxiang Shen, Wenjuan Wu, Long Chen","doi":"10.1007/978-1-4020-6018-2_69","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":19528,"journal":{"name":"Optical Instruments","volume":"20 1","pages":"541-545"},"PeriodicalIF":0.0000,"publicationDate":"2007-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Instruments","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.1007/978-1-4020-6018-2_69","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}