Failure analysis of die-bonding interfaces between LED chip and heat sink

Wei Liu, Shunong Zhang, Yushen Jin, T. Zhang, L. C. Guo
{"title":"Failure analysis of die-bonding interfaces between LED chip and heat sink","authors":"Wei Liu, Shunong Zhang, Yushen Jin, T. Zhang, L. C. Guo","doi":"10.1109/ICEPT.2016.7583390","DOIUrl":null,"url":null,"abstract":"The die bonding technology played a key role during the heat dissipating process in the high power LED packaging. At present, many manufacturers were confused about which kind of bonding technology they should choose. In this study, the high power LED devices from Cree and Lumileds were employed to study their die-bonding technologies. For the tested Cree's products, the initial interface had few voids before aged, however, under the action of injection current, the voids would initiated and propagated along the bonding boundary between LED chip and heats sink. For the tested Rebel LEDs, the crack and delamination of bonding pads were observed at the LED chip side.","PeriodicalId":6881,"journal":{"name":"2016 17th International Conference on Electronic Packaging Technology (ICEPT)","volume":"36 1","pages":"1423-1426"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 17th International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2016.7583390","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

The die bonding technology played a key role during the heat dissipating process in the high power LED packaging. At present, many manufacturers were confused about which kind of bonding technology they should choose. In this study, the high power LED devices from Cree and Lumileds were employed to study their die-bonding technologies. For the tested Cree's products, the initial interface had few voids before aged, however, under the action of injection current, the voids would initiated and propagated along the bonding boundary between LED chip and heats sink. For the tested Rebel LEDs, the crack and delamination of bonding pads were observed at the LED chip side.
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LED芯片与散热器之间的模键接口失效分析
在大功率LED封装散热过程中,晶片键合技术起着关键作用。目前,很多厂家对于应该选择哪种粘接技术感到困惑。在本研究中,采用Cree和Lumileds的大功率LED器件来研究它们的模合技术。对于被测的Cree产品,老化前的初始界面几乎没有空洞,但在注入电流的作用下,空洞会沿着LED芯片与散热器之间的键合边界产生并传播。对于测试的Rebel LED,在LED芯片侧观察到键合垫的裂纹和分层。
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