Effect of swift heavy ion irradiation on structural, electrical and optical properties of zinc-stannate thin films

Y. Kumar, Ravi Kumar, K. Asokan, Avineesh Singh
{"title":"Effect of swift heavy ion irradiation on structural, electrical and optical properties of zinc-stannate thin films","authors":"Y. Kumar, Ravi Kumar, K. Asokan, Avineesh Singh","doi":"10.1063/1.5122432","DOIUrl":null,"url":null,"abstract":"In the present study, 120 MeV Ag ions were irradiated onzinc-stannate (Zn-Sn-O) thin films. The modifications in the structural, electrical and optical properties were studied using grazing-incidence x-ray diffraction (GIXRD), two probe method and UV-Vis spectroscopy. The crystalline to amorphous phase transformation was observed from GIXRD data. The electrical studies revealed that the resistivity has increased with doping and on irradiation. The minimum resistivity of 14 mΩ cm, at room temperature, has been observed for pristine Zn-Sn-O thin film. The average optical transmittance was above 75% in visible region for both pristine and SHI Irradiated zinc-stannate thin films.In the present study, 120 MeV Ag ions were irradiated onzinc-stannate (Zn-Sn-O) thin films. The modifications in the structural, electrical and optical properties were studied using grazing-incidence x-ray diffraction (GIXRD), two probe method and UV-Vis spectroscopy. The crystalline to amorphous phase transformation was observed from GIXRD data. The electrical studies revealed that the resistivity has increased with doping and on irradiation. The minimum resistivity of 14 mΩ cm, at room temperature, has been observed for pristine Zn-Sn-O thin film. The average optical transmittance was above 75% in visible region for both pristine and SHI Irradiated zinc-stannate thin films.","PeriodicalId":7262,"journal":{"name":"ADVANCES IN BASIC SCIENCE (ICABS 2019)","volume":"18 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2019-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ADVANCES IN BASIC SCIENCE (ICABS 2019)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1063/1.5122432","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

In the present study, 120 MeV Ag ions were irradiated onzinc-stannate (Zn-Sn-O) thin films. The modifications in the structural, electrical and optical properties were studied using grazing-incidence x-ray diffraction (GIXRD), two probe method and UV-Vis spectroscopy. The crystalline to amorphous phase transformation was observed from GIXRD data. The electrical studies revealed that the resistivity has increased with doping and on irradiation. The minimum resistivity of 14 mΩ cm, at room temperature, has been observed for pristine Zn-Sn-O thin film. The average optical transmittance was above 75% in visible region for both pristine and SHI Irradiated zinc-stannate thin films.In the present study, 120 MeV Ag ions were irradiated onzinc-stannate (Zn-Sn-O) thin films. The modifications in the structural, electrical and optical properties were studied using grazing-incidence x-ray diffraction (GIXRD), two probe method and UV-Vis spectroscopy. The crystalline to amorphous phase transformation was observed from GIXRD data. The electrical studies revealed that the resistivity has increased with doping and on irradiation. The minimum resistivity of 14 mΩ cm, at room temperature, has been observed for pristine Zn-Sn-O thin film. The average optical transmittance was above 75% in visible region for both pristine and SHI Irradiated zinc-stannate thin films.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
快速重离子辐照对锡酸锌薄膜结构、电学和光学性能的影响
本研究采用120 MeV银离子辐照锡酸锌(Zn-Sn-O)薄膜。利用掠入射x射线衍射(GIXRD)、双探针法和紫外可见光谱研究了改性后的结构、电学和光学性能。通过x射线衍射(GIXRD)观察到晶体向非晶态相变。电学研究表明,电阻率随掺杂和辐照而增加。在室温下,原始Zn-Sn-O薄膜的最小电阻率为14 mΩ cm。原始锡酸锌薄膜和SHI辐照后的锡酸锌薄膜在可见光区的平均透过率均在75%以上。本研究采用120 MeV银离子辐照锡酸锌(Zn-Sn-O)薄膜。利用掠入射x射线衍射(GIXRD)、双探针法和紫外可见光谱研究了改性后的结构、电学和光学性能。通过x射线衍射(GIXRD)观察到晶体向非晶态相变。电学研究表明,电阻率随掺杂和辐照而增加。在室温下,原始Zn-Sn-O薄膜的最小电阻率为14 mΩ cm。原始锡酸锌薄膜和SHI辐照后的锡酸锌薄膜在可见光区的平均透过率均在75%以上。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Measurements of third-order optical nonlinearity using Z-scan technique: A review The role of correlated hopping on magnetic properties of spin-1/2 Falicov-Kimball model on a triangular lattice Radiation induced effects on silk fibroin films Synthesis and characterization of As40Se60 nanostructured film Rietveld refinement and structural characterization of (La1.2Sr0.8) InMnO6 nanopowders synthesized by coprecipitation method
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1