Sub-sampling PLL techniques

Xiang Gao, E. Klumperink, B. Nauta
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引用次数: 26

Abstract

In a classical PLL, the phase detector (PD) and charge pump (CP) noise is multiplied by N2, when referred to the VCO output, due to the divide-by-N in the feedback path. It often dominates the in-band phase noise and limits the achievable PLL jitter·power Figure-Of-Merit (FOM). A sub-sampling PLL uses a PD that sub-samples the high frequency VCO output with the reference clock. The PD and CP noise in this PLL is shown to be not multiplied by N2, and greatly attenuated by the high phase detection gain, leading to lower in-band phase noise and better PLL FOM. This article reviews the development of the PLL FOM, the sub-sampling PLL techniques and their applications in recent PLL architectures.
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分采样锁相环技术
在经典锁相环中,由于反馈路径中的除以n,当参考VCO输出时,鉴相器(PD)和电荷泵(CP)噪声乘以N2。它通常控制带内相位噪声并限制可实现的锁相环抖动·功率性能图(FOM)。分采样锁相环使用一个PD对参考时钟的高频压控振荡器输出进行分采样。结果表明,该锁相环中的PD和CP噪声不会乘以N2,并且由于高相位检测增益而大大衰减,从而导致更低的带内相位噪声和更好的锁相环FOM。本文综述了锁相环FOM、子采样锁相环技术及其在最新锁相环体系结构中的应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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