A soft-error hardened process portable embedded microprocessor

V. Vashishtha, L. Clark, S. Chellappa, Anudeep R. Gogulamudi, A. Gujja, Chad Farnsworth
{"title":"A soft-error hardened process portable embedded microprocessor","authors":"V. Vashishtha, L. Clark, S. Chellappa, Anudeep R. Gogulamudi, A. Gujja, Chad Farnsworth","doi":"10.1109/CICC.2015.7338366","DOIUrl":null,"url":null,"abstract":"An embedded microprocessor core designed to have high soft-error immunity is presented. The design achieves hardness via architectural, micro-architectural, and circuit techniques. The basis of the machine is a dual-redundant speculative pipeline that detects mismatches at their commission to architectural state. Added instructions allow software controlled recovery and restart of upset instructions. Key architectural state is stored in triple-mode redundant, self-correcting logic. Special automated place and route flows afford robustness against multiple node charge collection. Full clock gating allows low power, while redundant clocks mitigate clock upset induced errors. Register file based caches allow near-threshold low voltage operation. The design is implemented on a commercial 90-nm bulk CMOS process. Silicon results, including error correction examples, are presented.","PeriodicalId":6665,"journal":{"name":"2015 IEEE Custom Integrated Circuits Conference (CICC)","volume":"79 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE Custom Integrated Circuits Conference (CICC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2015.7338366","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

An embedded microprocessor core designed to have high soft-error immunity is presented. The design achieves hardness via architectural, micro-architectural, and circuit techniques. The basis of the machine is a dual-redundant speculative pipeline that detects mismatches at their commission to architectural state. Added instructions allow software controlled recovery and restart of upset instructions. Key architectural state is stored in triple-mode redundant, self-correcting logic. Special automated place and route flows afford robustness against multiple node charge collection. Full clock gating allows low power, while redundant clocks mitigate clock upset induced errors. Register file based caches allow near-threshold low voltage operation. The design is implemented on a commercial 90-nm bulk CMOS process. Silicon results, including error correction examples, are presented.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
一种软误差强化过程便携式嵌入式微处理器
提出了一种具有高软容错性的嵌入式微处理器内核。该设计通过建筑、微建筑和电路技术实现了硬度。这台机器的基础是一个双冗余的推测管道,它可以在它们进入架构状态时检测不匹配。增加的指令允许软件控制的恢复和重新启动心烦意乱的指令。关键架构状态以三模式冗余、自校正逻辑存储。特殊的自动化地点和路线流对多节点收费具有鲁棒性。全时钟门控允许低功耗,而冗余时钟减轻时钟干扰引起的错误。基于寄存器文件的缓存允许接近阈值的低电压操作。该设计是在商用90纳米体CMOS工艺上实现的。给出了硅的结果,包括误差修正的例子。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A 150nA IQ, 850mA ILOAD, 90% Efficiency over 10μA to 400mA Loading Range Introduction to Compute-in-Memory Portable and Scalable High Voltage Circuits for Automotive Applications in BiCMOS Processes ADC-based Wireline Transceiver Session 27 - Technology directions
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1