Strongly correlated electron behaviour in the compound CeRhSn

A. Ślebarski, M. Maple, E. J. Freeman, C. Sirvent, M. Radłowska, A. Jezierski, E. Granado, Q. Huang, J. W. Lynn
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引用次数: 15

Abstract

Abstract Electrical resistivity ρ, magnetic susceptibility χ, specific heat C, X-ray photoelectron spectroscopy (XPS) and X-ray and neutron diffraction measurements were made on the compound CeRhSn. The measurements reveal an enhancement of the electronic specific heat coefficient γ = C(T)/T ≈ 160 mJ mol−1 K−2 at about 1 K and non-Fermi-liquid-like temperature dependences ρ(T) α T 0.75 and χ(T) α T −0.5 at low temperatures. At high temperatures, the physical properties indicate Kondo-intermediate-valence behaviour. The XPS measurements are consistent with a Ce valence of 3.07. The neutron diffraction measurements reveal anomalies in the planar Ce-Rh and Ce-Ce bond distances in the vicinity of 100 K which are apparently associated with the Ce valence instability in CeRhSn.
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复合CeRhSn中的强相关电子行为
对复合CeRhSn进行了电阻率ρ、磁化率χ、比热C、x射线光电子能谱(XPS)、x射线和中子衍射等测量。测量结果表明,在约1k时,电子比热系数γ = C(T)/T≈160 mJ mol−1 K−2和非费米液体样温度依赖性ρ(T) α T 0.75和χ(T) α T−0.5增强。在高温下,其物理性质表现为近藤中间价行为。XPS测量结果与Ce价为3.07相一致。中子衍射测量结果表明,在100 K附近,平面Ce- rh和Ce-Ce键距离出现异常,这显然与CeRhSn中Ce价态的不稳定性有关。
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