Reliability prediction for IGBT solder joints using Clech Algorithm

Hua Lu, C. Bailey
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引用次数: 6

Abstract

The Clech Algorithm is an approximate method for the prediction of the stress state and damage of solder joints of electronics components such as Flipchip, Ball Grid Array that are undergone time dependent temperature load. It can be used to predict the reliability of solder joint under temperature cycling conditions. In this work, the application of this algorithm has been described and applied to predict the stress/strain and plastic work density in IGBT solder joints. The results are compared with 2D Finite Element analysis and it is concluded that the Clech Algorithm can be used for reliability prediction of IGBT solder joint.
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基于Clech算法的IGBT焊点可靠性预测
Clech算法是一种用于预测电子元件(如倒装芯片、球栅阵列等)受时变温度载荷时焊点应力状态和损伤的近似方法。该方法可用于预测温度循环条件下焊点的可靠性。本文描述了该算法的应用,并将其应用于预测IGBT焊点的应力/应变和塑性工作密度。结果与二维有限元分析结果进行了比较,表明Clech算法可用于IGBT焊点的可靠性预测。
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