Ultra-precision surface finishing by ion beam and plasma jet techniques—status and outlook

T. Arnold, G. Böhm, R. Fechner, J. Meister, A. Nickel, F. Frost, T. Hänsel, A. Schindler
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引用次数: 147

Abstract

Aspheric reflective optics are becoming more and more important for synchrotron radiation source and X-ray applications. The manufacture of such highly precise optical surfaces requires deterministic ultra-precision machining technologies.

The article focuses on the present status of development of ion beam finishing technology and of atmospheric plasma jet technology in Leibniz Institute of Surface Modification (IOM). The basics of the ion beam and the plasma jet processing technologies and the respective equipment and components developed or being under development for production purposes will be presented together with results on the ion beam figuring (IBF), ion beam smoothing (IBS), and the deep figuring and figure correction using atmospheric plasma jet machining (PJM) technique, respectively. Using IBF and IBS, we achieve nanometer and sub-nanometer accuracies over nearly the entire spectrum of spatial surface wavelength on a variety of materials. PJM technique has been developed to obtain high removal rates especially on silicon-based materials. Removal depths of some 10 μm can easily be achieved.

The article gives an outlook to future activities on developments of the techniques with respect to advanced X-ray optics.

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离子束和等离子体射流技术的超精密表面加工——现状与展望
非球面反射光学在同步辐射光源和x射线应用中变得越来越重要。这种高精度光学表面的制造需要确定性的超精密加工技术。本文重点介绍了莱布尼茨表面改性研究所离子束精加工技术和大气等离子体射流技术的发展现状。本文将介绍离子束和等离子体射流加工技术的基础知识,以及为生产目的而开发或正在开发的相应设备和部件,以及离子束整形(IBF)、离子束平滑(IBS)和利用大气等离子体射流加工(PJM)技术进行深度整形和图形校正的结果。利用IBF和IBS,我们在各种材料的几乎整个空间表面波长光谱上实现了纳米和亚纳米精度。PJM技术的发展是为了获得较高的去除率,特别是对硅基材料。可以很容易地实现约10 μm的去除深度。文章对先进x射线光学技术的发展前景进行了展望。
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来源期刊
CiteScore
3.20
自引率
21.40%
发文量
787
审稿时长
1 months
期刊介绍: Section A of Nuclear Instruments and Methods in Physics Research publishes papers on design, manufacturing and performance of scientific instruments with an emphasis on large scale facilities. This includes the development of particle accelerators, ion sources, beam transport systems and target arrangements as well as the use of secondary phenomena such as synchrotron radiation and free electron lasers. It also includes all types of instrumentation for the detection and spectrometry of radiations from high energy processes and nuclear decays, as well as instrumentation for experiments at nuclear reactors. Specialized electronics for nuclear and other types of spectrometry as well as computerization of measurements and control systems in this area also find their place in the A section. Theoretical as well as experimental papers are accepted.
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