A spectral resolution of Johann-type X-ray spectrometers

M. Stepanenko
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引用次数: 4

Abstract

This paper presents the analysis of the geometrical components in the evaluation of the spectral resolution of X-ray bent crystal spectrometers. A toroidal Johann–Johansson type spectrometer is suggested and its resolution is estimated. Emphasis is made on the study of asymmetrically cut schemes. Generally used expansion techniques up to second order are added by calculations of the third term where second order becomes zero.
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约翰型x射线光谱仪的光谱分辨率
本文对x射线弯曲晶体光谱仪光谱分辨率评定中的几何分量进行了分析。提出了一种环形约翰-约翰逊型光谱仪,并对其分辨率进行了估计。重点研究了非对称切割方案。通常使用的二阶展开技术是通过计算二阶变为零的第三项来增加的。
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Plasma Devices and Operations
Plasma Devices and Operations 物理-核科学技术
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