Generic Parameter Extraction of Inkjet-Printed OTFTs via Optimisation Using LTspice and MATLAB

Denis Shleifman, R. Griffin, A. Dadvand, T. Chu
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Abstract

Parameter extraction for organic thin film transistors (OTFTs) is often performed using the MOSFET square-law to model current-voltage (IV) characteristics. Usually the IV characteristics at a single drain voltage bias is used for fitting the mobility and extrapolating the threshold voltage. Described herein is a method of parameter extraction which fits a family of curves to any given model, and is not limited only to the square-law. Using LTspice, a freely available circuit simulation tool, coupled with MATLAB, a routine has been prepared which performs parameter extraction for OTFT measurement results across a family of curves via optimisation. The use of a circuit simulator allows a wide array of models to be used, and modified, to achieve more accurate circuit simulation performance and possibly provide insight into device behaviour.
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基于LTspice和MATLAB的喷墨打印otft优化通用参数提取
有机薄膜晶体管(OTFTs)的参数提取通常使用MOSFET平方定律来模拟电流-电压(IV)特性。通常,单漏极电压偏置下的IV特性用于拟合迁移率和外推阈值电压。本文描述的是一种参数提取方法,它适合于任何给定模型的曲线族,而不仅仅局限于平方律。利用LTspice(一种免费的电路仿真工具),结合MATLAB,编写了一个程序,通过优化对一系列曲线上的OTFT测量结果进行参数提取。电路模拟器的使用允许使用和修改各种模型,以实现更准确的电路仿真性能,并可能提供对器件行为的洞察。
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