Study of Package-on-Package solder joints under random vibration load based on Patran

Long Zhang, Chunyue Huang, Wei Huang, Tian-ming Li, Jianwei Hua
{"title":"Study of Package-on-Package solder joints under random vibration load based on Patran","authors":"Long Zhang, Chunyue Huang, Wei Huang, Tian-ming Li, Jianwei Hua","doi":"10.1109/ICEPT.2016.7583172","DOIUrl":null,"url":null,"abstract":"The 3D finite element analysis model of Package-on-Package solder joints was set up based on Patran software. The natural frequency, vibration mode of the model was analyzed under the condition of random vibration, the stress and strain distribution and the strain power spectrum density of response curves of the Package-on-Package solder joints were obtained, and the random vibration fatigue life of the Package-on-Package solder joints were also calculated out based on the power spectrum and rain flow count method; the influence of pad diameter on the random vibration fatigue life of the Package-on-Package solder joints were analyzed. The results show that the Package-on-Package solder joints of the model in this paper has the random vibration fatigue life of 997 hours; on the condition of the pad diameter of the second-layer solder joints increases from 0.15 mm to 0.30mm, the Package-on-Package solder joints vibration fatigue life increases with the increase of the pad diameter.","PeriodicalId":6881,"journal":{"name":"2016 17th International Conference on Electronic Packaging Technology (ICEPT)","volume":"32 1","pages":"443-447"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 17th International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT.2016.7583172","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

The 3D finite element analysis model of Package-on-Package solder joints was set up based on Patran software. The natural frequency, vibration mode of the model was analyzed under the condition of random vibration, the stress and strain distribution and the strain power spectrum density of response curves of the Package-on-Package solder joints were obtained, and the random vibration fatigue life of the Package-on-Package solder joints were also calculated out based on the power spectrum and rain flow count method; the influence of pad diameter on the random vibration fatigue life of the Package-on-Package solder joints were analyzed. The results show that the Package-on-Package solder joints of the model in this paper has the random vibration fatigue life of 997 hours; on the condition of the pad diameter of the second-layer solder joints increases from 0.15 mm to 0.30mm, the Package-on-Package solder joints vibration fatigue life increases with the increase of the pad diameter.
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基于Patran的随机振动载荷下封装焊点的研究
基于Patran软件建立了包对包焊点的三维有限元分析模型。分析了模型在随机振动条件下的固有频率、振动模态,得到了包对包焊点响应曲线的应力应变分布和应变功率谱密度,并基于功率谱法和雨流计数法计算了包对包焊点的随机振动疲劳寿命;分析了焊盘直径对包对包焊点随机振动疲劳寿命的影响。结果表明:本文模型的包对包焊点具有997小时的随机振动疲劳寿命;当第二层焊点的焊盘直径从0.15 mm增加到0.30mm时,随着焊盘直径的增加,封装对封装焊点的振动疲劳寿命增加。
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